面试系列：可测性设计【5】关于Rombist
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关于EmbeddedMemories
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随着半导体工艺的发展,可测性技术(DFT)成为每个芯片在设计中必须考虑的问题
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如何高效和高质量的测试芯片中的内嵌Memory,成为DFT技术中的关键技术
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本文针对rombist中的Memorymodel的产生算法和结果做一个分析和总结
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实际案例的具体分析和计算
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希望对大家的面试和工作有帮助
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MBIST Architect Architecture
- General Memory bist structure :
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When Should we Use Memory BIST?
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User should use Memory BIST:
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On medium to large embedded memories
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On memories that are contained within Intellectual Property (IP)that will be reused
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On memories that should be tested at speed
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On devices with multiple embedded memories
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On devices that are time-to-market critical
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On devices that run on ATEs with limited capability
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On SoCs where testing and verification will be difficult
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Advantages of Adding BIST
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Enables Intellectual Property (IP) reuse
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Reduces test application time and simplifies pattern generation
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Reduces amount of test data to store
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Facilitates hierarchical test capabilities -- lets you easily testat model, block, design, and system levels
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Merges test and design, reducing development time
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BIST controller can be shared across memories
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Disadvantages of Adding BIST
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Small area increase
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Adds Mux delay to memory data path
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Not as flexible as direct access testing
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Small routing and timing impact
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